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Modeling and Characterization of RF and Microwave Power FETs [精裝] (無線電和微波功率FET模型和特性)

  • 作者:Peter Aaen (彼得‧安恩) Jaime A. Plá,John Wood (約翰‧伍德) 著
  • 出版社: Cambridge University Press
  • 出版時間:2007-06-28
  • 商品編號: 19045697

    頁數:388

    裝幀:精裝


HK$1,382.80 (速遞費用須知)
購買額滿HK$158免運費
免郵費優惠僅限香港、澳门、
台灣及中國大陸

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內容簡介

This 2007 book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.



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